Lewis M. Terman's Condensed Guide to Revision of the Stanford Binet-Simon Intelligence Tests is a detailed study of the theory and practice of intelligence measurement using a modified version of the Binet-Simon test. This book is the basis for understanding and assessing the intellectual potential of children and adults. The author systematizes and explains the principles and methods used in the revision of intelligence tests, reveals their importance and influence on the results. This book is essential for psychology, pedagogy, and child development professionals interested in intelligence assessment and testing.